|
|||||||||||
|
Phone: +41 44 632 8345 |
Christian Metzger joined the Information Management group in 2005 and graduated with a Doctor of Sciences in 2008 (with highest honors). During his PhD, he was also a senior researcher at the Auto-ID Labs and the M-Lab (a joint initiative between University of St. Gallen and ETH Zurich). Christian holds a Master of Science degree in Information Technology and Electrical Engineering from ETH Zurich.
Christian was a visiting scientist at MIT (Massachusetts Institute of Technology) in 2007 where he worked on retail logistics optimization problems, and in 2004, he was a visiting scientist at the College of Computing at the Georgia Insitute of Technology in Atlanta (USA).
Member of the Auto-ID Labs.
Member of the M-Lab.
Research Interests
Keywords: Retail replenishment, process optimization, RFID, smart shelves.
Stockout situations in the retail industry result in significant losses of revenue. The introduction of automatic product availability monitoring systems for retail shelves suggests a significant reduction of stockouts and lower replenishment process costs. Christian's research focuses on inventory models that incorporate emerging technologies, specifically RFID item-level tagging and weight-sensitive sensors, to optimize the replenishment process based on a total cost function. The development of such technologies reveals further limitations for practical implementation that mathematical models have to account for.
Publications
Patents
Demos
Awards
Wichtiger Hinweis:
Diese Website wird in älteren Versionen von Netscape ohne
graphische Elemente dargestellt. Die Funktionalität der
Website ist aber trotzdem gewährleistet. Wenn Sie diese
Website regelmässig benutzen, empfehlen wir Ihnen, auf
Ihrem Computer einen aktuellen Browser zu installieren. Weitere
Informationen finden Sie auf
folgender
Seite.
Important Note:
The content in this site is accessible to any browser or
Internet device, however, some graphics will display correctly
only in the newer versions of Netscape. To get the most out of
our site we suggest you upgrade to a newer browser.
More
information